Soft Errors

FPGAs and Parallel Architectures for Aerospace Applications: Soft Errors and Fault-Tolerant Design

Fernanda Kastensmidt and Paolo Rech, "FPGAs and Parallel Architectures for Aerospace Applications: Soft Errors and Fault-Tolerant Design"
English | ISBN: 3319143514 | 2016 | 214 pages | PDF | 12 MB

Radiation Effects And Soft Errors In Integrated Circuits And Electronic Devices  eBooks & eLearning

Posted by tanas.olesya at March 7, 2016
Radiation Effects And Soft Errors In Integrated Circuits And Electronic Devices

Radiation Effects And Soft Errors In Integrated Circuits And Electronic Devices by Daniel M. Fleetwood
English | 29 July 2004 | ISBN: 9812389407 | 297 Pages | PDF | 16 MB

This book provides a detailed treatment of radiation effects in electronic devices, including effects at the material, device, and circuit levels. The emphasis is on transient effects caused by single ionizing particles and effects produced by the cumulative energy deposited by the radiation.

Soft Errors: From Particles to Circuits  

Posted by ksveta6 at March 9, 2015
Soft Errors: From Particles to Circuits

Soft Errors: From Particles to Circuits (Devices, Circuits, and Systems) by Jean-Luc Autran, Daniela Munteanu
2015 | ISBN: 1466590831 | English | 426 pages | PDF | 23 MB

Soft Errors in Modern Electronic Systems (repost)  

Posted by interes at Jan. 23, 2015
Soft Errors in Modern Electronic Systems (repost)

Soft Errors in Modern Electronic Systems (Frontiers in Electronic Testing) by Michael Nicolaidis
English | 2010-09-30 | ISBN: 1441969926 | PDF | 336 pages | 3,7 MB
Analysis and Design of Resilient VLSI Circuits: Mitigating Soft Errors and Process Variations (repost)

Analysis and Design of Resilient VLSI Circuits: Mitigating Soft Errors and Process Variations
by Rajesh Garg, Sunil P. Khatri
English | 2009 | ISBN: 1441909303 | 212 pages | PDF | 5.7 MB

Soft Errors in Modern Electronic Systems (repost)  

Posted by fdts at Sept. 15, 2014
Soft Errors in Modern Electronic Systems (repost)

Soft Errors in Modern Electronic Systems
by Michael Nicolaidis
English | 2010 | ISBN: 1441969926 | 336 pages | PDF | 3.41 MB
Terrestrial Neutron-Induced Soft Errors in Advanced Memory Devices (repost)

Terrestrial Neutron-Induced Soft Errors in Advanced Memory Devices by Takashi Nakamura, Eishi Yahagi, Hideaki Kameyama
English | 2008 | ISBN: 9812778810 | 368 pages | PDF | 14 MB

Terrestrial neutron-induced soft errors in semiconductor memory devices are currently a major concern in reliability issues. Understanding the mechanism and quantifying soft-error rates are primarily crucial for the design and quality assurance of semiconductor memory devices.
Terrestrial Neutron-Induced Soft Errors in Advanced Memory Devices (repost)

Takashi Nakamura, Eishi Yahagi, Hideaki Kameyama, "Terrestrial Neutron-Induced Soft Errors in Advanced Memory Devices"
2008 | ISBN: 9812778810 | 368 pages | PDF | 14 MB

Terrestrial neutron-induced soft errors in semiconductor memory devices are currently a major concern in reliability issues. Understanding the mechanism and quantifying soft-error rates are primarily crucial for the design and quality assurance of semiconductor memory devices.

Soft Errors in Modern Electronic Systems  

Posted by ChrisRedfield at March 12, 2013
Soft Errors in Modern Electronic Systems

Michael Nicolaidis - Soft Errors in Modern Electronic Systems
Published: 2010-09-30 | ISBN: 1441969926 | PDF | 336 pages | 3 MB
Dependability in Electronic Systems: Mitigation of Hardware Failures, Soft Errors, and Electro-Magnetic Disturbances (re)

Nobuyasu Kanekawa, Eishi H. Ibe, Takashi Suga, Yutaka Uematsu, "Dependability in Electronic Systems: Mitigation of Hardware Failures, Soft Errors, and Electro-Magnetic Disturbances"
Sp**ger | 2010 | ISBN: 1441967141 | PDF | 240 pages | 12,8 MB