Counterfeit Integrated Circuits Detection And Avoidance

Counterfeit Integrated Circuits: Detection and Avoidance

Mark (Mohammad) Tehranipoor, Ujjwal Guin, Domenic Forte, "Counterfeit Integrated Circuits: Detection and Avoidance"
English | ISBN: 3319118234 | 2015 | 292 pages | Epub (conv) | 3.5 MB
Counterfeit Integrated Circuits: Detection and Avoidance

Mark (Mohammad) Tehranipoor, Ujjwal Guin, Domenic Forte, "Counterfeit Integrated Circuits: Detection and Avoidance"
English | ISBN: 3319118234 | 2015 | 292 pages | PDF | 9 MB
Failure Analysis of Integrated Circuits: Tools and Techniques (Repost)

Lawrence C. Wagner, "Failure Analysis of Integrated Circuits: Tools and Techniques"
Springer | 1999 | ISBN: 0412145618 | 255 pages | PDF | 11,3 MB

Failure Analysis of Integrated Circuits: Tools and Techniques provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical failures in integrated circuits.
Digital Integrated Circuits: Analysis and Design by John E. Ayers [Repost]

Digital Integrated Circuits: Analysis and Design by John E. Ayers
English | 15 Dec. 2003 | ISBN: 084931951X | 720 Pages | PDF | 10 MB

There is no field of enterprise today more dynamic or more challenging than Digital Integrated Circuits. But because of its rapid development, the field has quickly outgrown most of the standard textbooks. The field is also decidedly interdisciplinary.
Failure Analysis of Integrated Circuits: Tools and Techniques by Lawrence C. Wagner (Repost)

Failure Analysis of Integrated Circuits: Tools and Techniques by Lawrence C. Wagner (Repost)
Publisher: Springer; 1st edition (January 31, 1999) | ISBN: 0412145618 | Pages: 255 | PDF | 11.33 MB

Failure Analysis of Integrated Circuits: Tools and Techniques provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical failures in integrated circuits. These include applications specific to performing failure analysis such as decapsulation, deprocessing, and fail site isolation, as well as physical and chemical analysis tools and techniques.
"Failure Analysis of Integrated Circuits: Tools and Techniques"  (Repost)

"Failure Analysis of Integrated Circuits: Tools and Techniques"
Publisher: Springer | 1999 | 255 pages | ISBN: 0412145618 | PDF | 11,3 MB

Failure Analysis of Integrated Circuits: Tools and Techniques provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical failures in integrated circuits. These include applications specific to performing failure analysis such as decapsulation, deprocessing, and fail site isolation, as well as physical and chemical analysis tools and techniques. The coverage is qualitative, and it provides a general understanding for making intelligent tool choices. Also included is coverage of the shortcomings, limitations, and strengths of each technique.
Failure Analysis of Integrated Circuits: Tools and Techniques (repost)

Lawrence C. Wagner, "Failure Analysis of Integrated Circuits: Tools and Techniques"
Springer | 1999 | ISBN: 0412145618 | 255 pages | PDF | 11,3 MB

Digital Integrated Circuits: Analysis and Design  

Posted by Specialselection at Jan. 1, 2014
Digital Integrated Circuits: Analysis and Design

John E. Ayers, "Digital Integrated Circuits: Analysis and Design"
English | 2003-12-15 | ISBN: 084931951X | 721 pages | PDF | 10.9 mb
Failure Analysis of Integrated Circuits: Tools and Techniques (repost)

Lawrence C. Wagner, "Failure Analysis of Integrated Circuits: Tools and Techniques"
Springer | 1999 | ISBN: 0412145618 | 255 pages | PDF | 11,3 MB
Failure Analysis of Integrated Circuits: Tools and Techniques

Lawrence C. Wagner, "Failure Analysis of Integrated Circuits: Tools and Techniques"
Springer; 1st edition | ISBN: 0412145618 | 255 pages | PDF | 10 Mb